Janez Kovač is a senior research associate at Jozef Stefan Institute and professor at the International Postgraduate School Jozef Stefan. He is the head of the Laboratory for Surface and Thin Film Analyses at Jozef Stefan Institute. The main fields of scientific interest of Janez Kovac are the precise characterization of surfaces and thin films at a nanometric scale with X-ray photoelectron spectroscopy- XPS, Secondary ion mass spectroscopy – SIMS, the study of reactions at solid surfaces, in 2D materials and thin films, functionalization and plasma treatments of solid surfaces, depth profiling of multilayer structures and other vacuum technologies. He is involved in the characterization and application of quantum dots of different materials.
Prof. Tomaž Rejec
Tomaž Rejec is a researcher in the field of solid-state theory at the Department of Theoretical Physics of the Jožef Stefan Institute and an associate professor of physics at the Faculty of Mathematics and Physics of the University of Ljubljana. He investigates the...